Name | Designation | Contact | Specialization | ||
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Dr. B. SHANTHI | PROFESSOR (CISL. PHYSICS) | au_shan@yahoo.com 9486786611 | |||
Dr. N. SUNDARAGANESAN | PROFESSOR (CISL. PHYSICS) | sundaraganesan@yahoo.com 9442068405 |
CENTRALISED INSTRUMENTATION AND SERVICE LABORATORY(CISL) |
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The Centralised Instrumentation and Service Laboratory (CISL) came into existence during the 5th plan period (1978). This was funded by U.G.C. with an objective to cater to the needs of the researchers to meet the emerging changes and challenges of to-day in the realms of experimental research. |
FIELD EMMISSION SCANNING ELECTRON MICROSCOPE
It provides ultra high resolution imaging at low accelerating voltages and small working distances.
Contact: Mr. M.Gomugan
FESEM operator Mob. : 9514452372 e-mail: cisl.au2019@yahoo.com
SCANNING ELECTRON MICROSCOPE (SEM) with EDS JEOL-JSM – IT 200
To study morphological, topographical and compositional information about the surface of the sample.
Contact: Mr.S.Selvakumar
Mob.: 8489623121 e-mail: cisl.au2019@yahoo.com
LASER SCANNING CONFOCAL MICROSCOPE NIKON- A1 MP
To study the morphology of cells and tissues - multiple 2D images at different depths
Contact: Dr.B.Shanthi
Professor Mob. : 9486786611 e-mail: cisl.au2019@yahoo.com
FLUORESCENCE ASSISTED CELL SORTER (FACS) BD - FACS ARIA III
This is to count, sort, and profile cells in a heterogeneous fluid mixture. It provides rapid analysis of multiple characteristics of single cells - both qualitative and quantitative,
Contact: Mr.K.Monikandan
Assistant Technical officer Mob.: 9940724565 e-mail: cisl.au2019@yahoo.com
INDUCTIVELY COUPLED PLASMA - MASS SPECTROPHOTOMETER AGILENT – 7700x
It measures the trace elements available in the sample (ppb)
Contact: Mr.S.Selvakumar
Mob.: 8489623121 e-mail: cisl.au2019@yahoo.com
ATOMIC FORCE MICROSCOPE
It is capable of measuring nanometer scale images of the sample (topography) with little or no sample preparation as well as measuring 3D image of surfaces.
Contact: Dr.B.Shanthi
Professor Mob. : 9486786611 e-mail: cisl.au2019@yahoo.com
SIMULTANEOUS THERMAL ANALYSER NETZSCH - STA 449 F3 JUPITER
Contact:Mr.S.Senthil Murugan
Technical officer Mob.: 9965571306 e-mail: cisl.au2019@yahoo.com
UV-VISIBLE SPECTROPHOTOMETER SHIMADZU – UV 1800
Contact:Mr.S.Senthil Murugan
Technical officer Mob.: 9965571306 e-mail: cisl.au2019@yahoo.com
MINOR EQUIPMENTS FLAME PHOTOMETERSYSTRONICS - FP 130 To determine the concentration of Na, K and Ca of the liquid sample
DIGITAL CONDUCTIVITY / TDS METER DEEP VISION – Model 641It measures the pH of the aqueous solution.
DIGITAL pH METER DEEP VISION – Model 101It measures the pH of the aqueous solution.
MISCELLANEOUS EQUIPMENT
Contact: Downloads REQUISITION FOR ATOMIC FORCE MICROSCOPE (AFM) |